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Cryo-XPS: A new technique for the quantitative analysis of the structure of electric double layer at colloidal particles?
Umeå University, Faculty of Science and Technology, Department of Chemistry.
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2020 (English)In: Colloids and Surfaces A: Physicochemical and Engineering Aspects, ISSN 0927-7757, E-ISSN 1873-4359, Vol. 586, article id 124234Article in journal (Refereed) Published
Abstract [en]

There is a long-lasting uncertainty as to the structure of the metal oxide/water interface. Various structures have especially been invoked to rationalize the seemingly anomalous silica/water interface. But, none of them seems to be approved in a quantitative and systematic way. We show that the concentration ratio of monovalent counterions and coions around colloidal silica spheres, as detected by the cryo-XPS technique, follows fundamental theoretical predictions of either Boltzmann or Donnan distribution. It is suggested that the reason of the dual response is the formation of the swelling gel layer on the silica surface due to its longer contact with water.

Place, publisher, year, edition, pages
Elsevier, 2020. Vol. 586, article id 124234
Keywords [en]
Colloidal silica, Cryo-XPS, Electric double layer, Gouy-Chapman theory, Flory-Donnan theory
National Category
Physical Chemistry Water Engineering Inorganic Chemistry Other Chemistry Topics Materials Chemistry
Identifiers
URN: urn:nbn:se:umu:diva-167735DOI: 10.1016/j.colsurfa.2019.124234ISI: 000504350600043OAI: oai:DiVA.org:umu-167735DiVA, id: diva2:1390712
Available from: 2020-02-03 Created: 2020-02-03 Last updated: 2020-02-04Bibliographically approved

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Shchukarev, Andrey

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Department of Chemistry
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Colloids and Surfaces A: Physicochemical and Engineering Aspects
Physical ChemistryWater EngineeringInorganic ChemistryOther Chemistry TopicsMaterials Chemistry

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