Change search
ReferencesLink to record
Permanent link

Direct link
A method for screening of coverage and film thickness of monolayers by projection of molecular electron density surface onto a substrate plane
Umeå University, Faculty of Science and Technology, Chemistry.
Umeå University, Faculty of Science and Technology, Chemistry.
2001 (English)In: Materials Letters, Vol. 49, no 3-4, 147-153 p.Article in journal (Refereed) Published
Abstract [en]

Self-assembled monolayer films of a copper tetraazaphthalocyanine have been prepared on quartz and silicon at 120°C in DMF solution and at 250°C in bromonaphthalene solution. A procedure is presented for obtaining film thickness for a sufficiently dense monolayer by fitting the 2D image of the 3D electron density surface of the chromophore in the film to a surface-coverage measure derived from absorption spectroscopy. The film thickness obtained by the electron density projection method is compared to that from ellipsometry. The projection method is expected to be useful for film-screening purposes and can also yield an average angle between the surface and chromophore normals.

Place, publisher, year, edition, pages
2001. Vol. 49, no 3-4, 147-153 p.
Keyword [en]
Monolayer, SAM film, Thin film, Absorption spectroscopy, Azaphthalocyanine, Pyridinoporphyrazine
URN: urn:nbn:se:umu:diva-9189DOI: doi:10.1016/S0167-577X(00)00359-1OAI: diva2:148860
Available from: 2008-03-07 Created: 2008-03-07 Last updated: 2011-01-13Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full text

Search in DiVA

By author/editor
Eliasson, Bertil
By organisation

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 23 hits
ReferencesLink to record
Permanent link

Direct link