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Low temperature microhardness of Xe-intercalated fullerite C60
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2005 (English)In: Low Temperature Physics, ISSN 1063-777X, Vol. 31, no 5, 454-458 p.Article in journal (Refereed) Published
Abstract [en]

The Vickers microhardness of Xe-intercalated polycrystalline fullerite C60 (XexC60, x~=0.35) is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness of the material (by a factor of 2 to 3) as compared to that of pure C60 single crystals is observed. It is shown that the step-like anomaly in the temperature dependences of the microhardness of pure C60 single crystals recorded under the orientational fcc-sc phase transition (Tc~=260 K) is also qualitatively retained for XexC60, but its onset is shifted by 40 K towards lower temperatures and the step becomes less distinct and more smeared. This behavior of H-barV(T) correlates with x-ray diffraction data, the analysis of which revealed a considerable influence of xenon interstitial atoms on the peculiar features of fullerite thermal expansion due to orientational phase transitions (see the paper by A.I. Prokhvatilov et al. in this issue).

Place, publisher, year, edition, pages
2005. Vol. 31, no 5, 454-458 p.
Keyword [en]
Fullerenes, C60, polyamorphism, hardness, orientational glass, Xenon, Xe, XRD, intercalation, transition temperature, structure
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:umu:diva-12440DOI: doi:10.1063/1.1925374OAI: oai:DiVA.org:umu-12440DiVA: diva2:152111
Note
Simultaneous publication in Fizika Nizkikh Temperatur vol. 31, p. 596-601 (2005)Available from: 2008-01-29 Created: 2008-01-29 Last updated: 2011-01-12Bibliographically approved

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Publisher's full texthttp://link.aip.org/link/?LTPHEG/31/454/1

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