XPS at solid-solution interface: experimental approaches
2006 (English)In: Surface and Interface Analysis, Vol. 38, 682-5 p.Article in journal (Refereed) Published
XPS is a very useful technique to study physicochemical phenomena at the solid-solution interface. It is essential that the interface remains unaltered during sample preparation and analysis.
Experimental approaches dealing with this problem are reviewed and discussed. They include differential pumping, controlled adsorption/condensation from gas phase, fast freezing, and freeze-drying. A recently developed fast-freezing procedure of wet pastes that are obtained from powder suspensions by centrifuging is described. This method allows for estimating surface point-of-zero charge, thickness, and potential of electrical double layer from XPS data. New experimental findings on mineral-solution interfaces are presented. Copyright © 2006 John Wiley & Sons, Ltd.
Place, publisher, year, edition, pages
2006. Vol. 38, 682-5 p.
XPS, solid-solution interface, fast freezing, electrical double layer
IdentifiersURN: urn:nbn:se:umu:diva-12547DOI: doi:10.1002/sia.2162OAI: oai:DiVA.org:umu-12547DiVA: diva2:152218