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Depth for dose calibration in high energy photon beams
Umeå University, Faculty of Medicine, Department of Radiation Sciences, Radiation Physics.
Umeå University, Faculty of Medicine, Department of Radiation Sciences, Radiation Physics.
Umeå University, Faculty of Medicine, Department of Radiation Sciences, Radiation Physics.
Umeå University, Faculty of Medicine, Department of Radiation Sciences, Radiation Physics.
1997 (English)In: Radiotherapy and Oncology, ISSN 0167-8140, E-ISSN 1879-0887, Vol. 43, no 3, 311-313 p.Article in journal (Refereed) Published
Abstract [en]

Background and purpose: The normalisation depth for determination of output factors in photon fields has frequently been the depth of dose maximum. At high energies the contribution from contaminating electrons is significant at dose maximum and is critically dependent on the beam geometry parameters, which is why a larger depth should be preferred.

Materials and methods: The effect of electron contamination was studied using a purging magnet to remove charged particles from the treatment head and a helium bag to minimise production between the head and the phantom.

Results: A depth of 10 cm was found to be beyond the range of the contaminating electrons for photon energies up to 20 MV (TPR1020 = 0.772). However, at 50 MV (TPR1020 = 0.810) contaminating electrons contribute 2-3% to the absorbed dose at 10 cm depth.

Conclusions: 10 cm is recommended as both reference and normalisation depth for all megavoltage photon beam qualities, i.e. Co-60 and X-rays from accelerators up to 50 MV. (C) 1997 Elsevier Science Ireland Ltd.

Place, publisher, year, edition, pages
1997. Vol. 43, no 3, 311-313 p.
Keyword [en]
Reference depth; Normalisation depth; Electron contamination
Identifiers
URN: urn:nbn:se:umu:diva-39953DOI: 10.1016/S0167-8140(97)00062-5ISI: A1997XG70400012OAI: oai:DiVA.org:umu-39953DiVA: diva2:396917
Available from: 2011-02-11 Created: 2011-02-11 Last updated: 2017-12-11Bibliographically approved

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Sjögren, RickardKarlsson, Magnus GKarlsson, MikaelSvensson, Hans
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