Open this publication in new window or tab >>2026 (English)In: Measurement, ISSN 0263-2241, E-ISSN 1873-412X, Vol. 257, article id 118947Article in journal (Refereed) Published
Abstract [en]
This study explores the correlation between thermal, electrical, and structural properties of metals, alloys, and single-crystal semiconductors using photothermal techniques, electrical methods, and X-ray diffraction. Polycrystalline metals (Al, Pt, Ti, Cu, AISI 1030 steel, α-brass) and semiconductors (Si, GaSb-Te) were systematically analyzed. Thermal diffusivity was measured using Frequency Domain Photoacoustic (FDPA), and thermal conductivity and volumetric heat capacity using the Thermal Relaxation Method (TRM). A thermal diffusivity image for a Si sample was taken to show the influence of mechanical damage on the thermal transport properties. The structural properties were determined using X-ray diffraction, while the electrical properties were evaluated using the Van der Pauw method. The results show a strong correlation between the thermal, electrical, and structural properties of the materials, specifically with respect to crystallite size and space group. The thermal conductivity is influenced by the crystallite size, while electrical conductivity varies due to extrinsic factors, especially for polycrystalline metals. These results suggest that the Wiedemann-Franz theory needs to be re-evaluated by considering both intrinsic and extrinsic influences on material behavior.
Place, publisher, year, edition, pages
Elsevier, 2026
Keywords
Intrinsic and extrinsic, Phono-electron interaction, Transport properties, Wiedemann-Franz Law
National Category
Condensed Matter Physics
Identifiers
urn:nbn:se:umu:diva-245637 (URN)10.1016/j.measurement.2025.118947 (DOI)001582277300004 ()2-s2.0-105015539460 (Scopus ID)
2025-10-162025-10-162025-10-16Bibliographically approved